Nanoscale AFM and TEM Observations of Elementary Dislocation Mechanisms. 1st ed. 2017

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Nanoscale AFM and TEM Observations of Elementary Dislocation Mechanisms. 1st ed. 2017

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書誌詳細
第一著者:	Veselý, Jozef
フォーマット:	図書
言語:	English
出版事項:	Springer International Publishing 2020
主題:	Physics Spectroscopy and Microscopy Characterization and Evaluation of Materials Condensed Matter Physics
オンライン･アクセス:	http://doi.org/10.1007/978-3-319-48302-3 https://scholar.dlu.edu.vn/thuvienso/handle/DLU123456789/98462
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