Nanoscale AFM and TEM Observations of Elementary Dislocation Mechanisms. 1st ed. 2017

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Nanoscale AFM and TEM Observations of Elementary Dislocation Mechanisms. 1st ed. 2017

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Opis bibliograficzny
1. autor:	Veselý, Jozef
Format:	Książka
Język:	English
Wydane:	Springer International Publishing 2020
Hasła przedmiotowe:	Physics Spectroscopy and Microscopy Characterization and Evaluation of Materials Condensed Matter Physics
Dostęp online:	http://doi.org/10.1007/978-3-319-48302-3 https://scholar.dlu.edu.vn/thuvienso/handle/DLU123456789/98462
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Thư viện lưu trữ:	Thư viện Trường Đại học Đà Lạt

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