Industrial X-Ray Computed Tomography. 1st ed. 2018

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Industrial X-Ray Computed Tomography. 1st ed. 2018

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Библиографические подробности
Главные авторы:	Carmignato, Simone, Dewulf, Wim, Leach, Richard
Формат:	‌
Язык:	English
Опубликовано:	Springer International Publishing 2020
Предметы:	Materials Science Characterization and Evaluation of Materials Optical and Electronic Materials Atomic, Molecular, Optical and Plasma Physics
Online-ссылка:	http://doi.org/10.1007/978-3-319-59573-3 https://scholar.dlu.edu.vn/thuvienso/handle/DLU123456789/99858
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Thư viện lưu trữ:	Thư viện Trường Đại học Đà Lạt

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