Recent development of electron microscopy 1987

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Recent development of electron microscopy 1987

Αποθηκεύτηκε σε:

Λεπτομέρειες βιβλιογραφικής εγγραφής
Μορφή:	Βιβλίο
Γλώσσα:	Undetermined
Έκδοση:	Japan International Dept. Business Center for Academic Societies Japan c1988
Θέματα:	Electron microscopy Congresses
Ετικέτες:	Προσθήκη ετικέτας Δεν υπάρχουν, Καταχωρήστε ετικέτα πρώτοι!

Thư viện lưu trữ:	Trung tâm Học liệu Trường Đại học Cần Thơ

Παρόμοια τεκμήρια

Principles and techniques of electron microscopy :
Έκδοση: (2000)

Electron microscopy :
ανά: Bozzola, John J.
Έκδοση: (1991)

Light microscopy in biology
Έκδοση: (1999)

Application of high-angle annular dark field scanning transmission electron microscopy, scanning transmission electron microscopy-energy dispersive X-ray spectrometry, energy-filtered transmission electron microscopy to the characterization of nanoparticles in the environment /
ανά: Utsunomiya, Satoshi.

Transmission Electron Microscopy A Textbook for Materials Science
ανά: David, B. Williams
Έκδοση: (2009)

Scanning Electron Microscopy and X-Ray Microanalysis. 4th ed.
ανά: Goldstein, Joseph I., κ.ά.
Έκδοση: (2020)

Scanning transmission X-ray, laser scanning, transmission electron microscopy mapping of the exopolymeric matrix of microbial biofilms /

Electron and fluorescence microscopy of extracellular glucan and aryl-alcohol oxidase during wheat-straw degradation by pleurotus eryngii /

Advanced Computing in Electron Microscopy
ανά: Kirkland, Earl J.
Έκδοση: (2020)

Determination of bacterial cell dry mass by transmission electron microscopy and densitometric image analysis /
ανά: Loferer-Krobbacher, M.

Recent developments in gravity /
Έκδοση: (2003)

Microstructure of natural plywood-like ceramics : A study by high-resolution electron microscopy and energy-variable X-ray diffraction /
ανά: Pokroy, Boaz.

Field Emission Scanning Electron Microscopy. 1st ed. 2018
ανά: Brodusch, Nicolas, κ.ά.
Έκδοση: (2020)

Springer Handbook of Microscopy. 1st ed. 2019
ανά: Hawkes, Peter W., κ.ά.
Έκδοση: (2020)

3rd International Multidisciplinary Microscopy and Microanalysis Congress (InterM). 1st ed. 2017
ανά: Oral, Ahmet Yavuz, κ.ά.
Έκδοση: (2020)

Coherent nonlinear optical imaging : Beyond fluorescence microscopy /

Addressable microelectrode arrays : Characterization by imaging with scanning electrochemical microscopy /

Quantum coherent control for nonlinear spectroscopy and microscopy /
ανά: Silberberg, Yaron.

Advanced Transmission Electron Microscopy (Applications to Nanomaterials)
ανά: Deepak, Francis Leonard, κ.ά.
Έκδοση: (2015)

Plant microtechnique and microscopy
ανά: Ruzin, Steven E.
Έκδοση: (1999)

Confocal Raman Microscopy
ανά: Toporski, Jan, κ.ά.
Έκδοση: (2020)

Recent developments in catfish aquaculture
Έκδοση: (1994)

Handbook of biomedical nonlinear optical microscopy
ανά: Masters, Barry R.
Έκδοση: (2008)

Recent developments in fish otolith research; No.2
Έκδοση: (1995)

Recent developments in fish otolith research; No.1

Recent developments in fish otolith research; No.5
Έκδοση: (1995)

Recent developments in fish otolith research; No.4
Έκδοση: (1995)

Kelvin Probe Force Microscopy
ανά: Sadewasser, Sascha, κ.ά.
Έκδοση: (2020)

Japan electronics almanac 1987
Έκδοση: (1987)

52nd Electronic Components & Technology Conference 2002, San Diego,CA USA
Έκδοση: (2002)

Noncontact Atomic Force Microscopy: Volume 3
ανά: Morita, S, κ.ά.
Έκδοση: (2016)

Optical-trapping raman microscopy detection of single unilamellar lipid vesicles /
ανά: Cherney, Daniel P.

4th electronics packaging technology conference (EPTC 2002)
Έκδοση: (2002)

Introduction to Light Microscopy
ανά: Lawlor, Dee
Έκδοση: (2020)

Noncontact Atomic Force Microscopy
ανά: Morita, Seizo, κ.ά.
Έκδοση: (2020)

In situ microscopy for on-line determination of biomass /
ανά: Bittner, C.

The physics and applications of high brightness electron beams : proceedings of the 46th Workshop of the INFN ELOISATRON Project : Erice, Italy, 9-14 October 2005 /
Έκδοση: (2007)

Nanotechnology and nano-interface controlled electronic devices
Έκδοση: (2005)

Electron beam ion sources and traps and their applications : 8th international symposium, EBIS/T 2000, Upton, New York, 5-8 November 2000 /
Έκδοση: (2001)

New horizons of applied scanning electron microscopy
ανά: Shimizu, Kenichi
Έκδοση: (2010)