Electron beam ion sources and traps and their applications : 8th international symposium, EBIS/T 2000, Upton, New York, 5-8 November 2000 /

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Detaylı Bibliyografya
Müşterek Yazar: International Symposium on Electron Beam Ion Sources and Traps and their Applications Upton, N.Y.)
Diğer Yazarlar: Prelec, Krsto.
Materyal Türü: Sách giấy
Baskı/Yayın Bilgisi: Melville, N.Y. : American Institute of Physics, 2001.
Seri Bilgileri:AIP conference proceedings ; no. 572.
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