Application of femtosecond laser ablation time-of-flight mass spectrometry to in-depth multilayer analysis /

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Application of femtosecond laser ablation time-of-flight mass spectrometry to in-depth multilayer analysis /

Đã lưu trong:

Chi tiết về thư mục
Tác giả chính:	Margetic, Vanja.
Tác giả khác:	Hergenroder, Roland., Niemax, Kay.
Định dạng:	Bài viết
Ngôn ngữ:	English
Những chủ đề:	Laser ablation technique Mass spectrometry Multilayer Silicon Thin films
Các nhãn:	Thêm thẻ Không có thẻ, Là người đầu tiên thẻ bản ghi này!

Thư viện lưu trữ:	Thư viện Trường Đại học Đà Lạt

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