Application of femtosecond laser ablation time-of-flight mass spectrometry to in-depth multilayer analysis /

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Application of femtosecond laser ablation time-of-flight mass spectrometry to in-depth multilayer analysis /

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Bibliografski detalji
Glavni autor:	Margetic, Vanja.
Daljnji autori:	Hergenroder, Roland., Niemax, Kay.
Format:	Članak
Jezik:	English
Teme:	Laser ablation technique Mass spectrometry Multilayer Silicon Thin films
Oznake:	Dodaj oznaku Bez oznaka, Budi prvi tko označuje ovaj zapis!

Thư viện lưu trữ:	Thư viện Trường Đại học Đà Lạt

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