Application of femtosecond laser ablation time-of-flight mass spectrometry to in-depth multilayer analysis /

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Application of femtosecond laser ablation time-of-flight mass spectrometry to in-depth multilayer analysis /

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Detalles Bibliográficos
Autor Principal:	Margetic, Vanja.
Outros autores:	Hergenroder, Roland., Niemax, Kay.
Formato:	Artigo
Idioma:	English
Những chủ đề:	Laser ablation technique Mass spectrometry Multilayer Silicon Thin films
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Thư viện lưu trữ:	Thư viện Trường Đại học Đà Lạt

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