Application of femtosecond laser ablation time-of-flight mass spectrometry to in-depth multilayer analysis /

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Application of femtosecond laser ablation time-of-flight mass spectrometry to in-depth multilayer analysis /

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Bibliographische Detailangaben
1. Verfasser:	Margetic, Vanja.
Weitere Verfasser:	Hergenroder, Roland., Niemax, Kay.
Format:	Artikel
Sprache:	English
Schlagworte:	Laser ablation technique Mass spectrometry Multilayer Silicon Thin films
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

Thư viện lưu trữ:	Thư viện Trường Đại học Đà Lạt

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