Using matrix peaks to map topography : Increased mass resolution and enhanced sensitivity in chemical imaging /

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Údair Eile:	Eijkel, Gert B., Heeren, Ron M. A., Koster, Sander., Luxembourg, Stefan L., McDonnell, Liam A., Mize, Todd H., Rooij, Nico F. de., Verpoorte, Elisabeth.
Formáid:	Bài viết
Teanga:	English
Ábhair:	Deconvolution Imaging Principal component analysis Secondary ion mass spectrometry Sensitivity Topography
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