Using matrix peaks to map topography : Increased mass resolution and enhanced sensitivity in chemical imaging /

Using matrix peaks to map topography : Increased mass resolution and enhanced sensitivity in chemical imaging /

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Bibliographic Details
Other Authors: Eijkel, Gert B., Heeren, Ron M. A., Koster, Sander., Luxembourg, Stefan L., McDonnell, Liam A., Mize, Todd H., Rooij, Nico F. de., Verpoorte, Elisabeth.
Format: Article
Language:English
Subjects:
Deconvolution
Imaging
Principal component analysis
Secondary ion mass spectrometry
Sensitivity
Topography
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Institutions: Thư viện Trường Đại học Đà Lạt
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