Using matrix peaks to map topography : Increased mass resolution and enhanced sensitivity in chemical imaging /

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Using matrix peaks to map topography : Increased mass resolution and enhanced sensitivity in chemical imaging /

Αποθηκεύτηκε σε:

Λεπτομέρειες βιβλιογραφικής εγγραφής
Άλλοι συγγραφείς:	Eijkel, Gert B., Heeren, Ron M. A., Koster, Sander., Luxembourg, Stefan L., McDonnell, Liam A., Mize, Todd H., Rooij, Nico F. de., Verpoorte, Elisabeth.
Μορφή:	Άρθρο
Γλώσσα:	English
Θέματα:	Deconvolution Imaging Principal component analysis Secondary ion mass spectrometry Sensitivity Topography
Ετικέτες:	Προσθήκη ετικέτας Δεν υπάρχουν, Καταχωρήστε ετικέτα πρώτοι!

Thư viện lưu trữ:	Thư viện Trường Đại học Đà Lạt

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