Resonance and nonresonant laser ionization of sputtered uranium atoms from thin films and single microparticles : Evaluation of a combined system for particle trace analysis /

Resonance and nonresonant laser ionization of sputtered uranium atoms from thin films and single microparticles : Evaluation of a combined system for particle trace analysis /

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Altri autori: Benninghoven, Alfred., Betti, Maria., Erdmann, Nicole., Gruning, Carsten., Kollmer, Felix., Lievens, Peter., Philipsen, Vicky., Silverans, Roger E., Vandeweert, Erno.
Natura: Articolo
Lingua:English
Soggetti:
Autoionizing state
Microparticle
Multiphoton ionization
Particle size
Resonance ionization mass spectroscopy
Thin films
Trace analysis
Uranium
Uranium oxide
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