Resonance and nonresonant laser ionization of sputtered uranium atoms from thin films and single microparticles : Evaluation of a combined system for particle trace analysis /

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Detalles Bibliográficos
Otros Autores:	Benninghoven, Alfred., Betti, Maria., Erdmann, Nicole., Gruning, Carsten., Kollmer, Felix., Lievens, Peter., Philipsen, Vicky., Silverans, Roger E., Vandeweert, Erno.
Formato:	Artículo
Lenguaje:	English
Materias:	Autoionizing state Microparticle Multiphoton ionization Particle size Resonance ionization mass spectroscopy Thin films Trace analysis Uranium Uranium oxide
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