A study of the curvature of a thick ALN film grown on a trench-patterned α-Al2O3 template using X-ray diffraction
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| Jazyk: | vie |
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| On-line přístup: | https://dlib.udn.vn/module/chi-tiet-sach?RecordID=9349 |
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| Thư viện lưu trữ: | Trung tâm Công nghệ thông tin và Học liệu số, Đại học Đà Nẵng |
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