A study of the curvature of a thick ALN film grown on a trench-patterned α-Al2O3 template using X-ray diffraction
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Lignende værker
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Multi-Scale Characterization of Crystalline Properties in Thick AlN Epitaxial Films Grown on Trench-Patterned Templates
af: Dinh Thanh Khan -
Templating the patterning of gold nanoparticles using a stained triblock copolymer film surface /
af: Ansari, Imtiyaz A. -
Reduction of Cr(VI) at a polyaniline film : Influence of film thickness and oxidation state /
af: Farrell, Sinead T. -
Coated polystyrene particles as templates for ordered macroporous silica structures with controlled wall thickness /
af: Hotta, Yuji. -
RAMAN SPECTROSCOPY OF GaN/AlxGa1-xN/AlN/Si STRUCTURES
af: Nguyen, Linh Chi, et al.
Udgivet: (2023)