Bandgap-dependent onset behavior of output characteristics in line-tunneling field-effect transistors

The onset behavior of output characteristics in tunnel field-effect transistors (TFETs) importantly determines the performance of digital TFET-based circuits. In this paper, we analytically and numerically examine the dependence of the onset behavior of output characteristics on the bandgap of semic...

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Hlavní autoři: Chun-Hsing Shih, Nguyễn, Đăng Chiến
Médium: Journal article
Jazyk:English
Vydáno: 2023
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On-line přístup:https://scholar.dlu.edu.vn/handle/123456789/2075
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