Hot Carrier Degradation in Semiconductor Devices
This book provides readers with a variety of tools to address the challenges posed by hot carrier degradation, one of today’s most complicated reliability issues in semiconductor devices. Coverage includes an explanation of carrier transport within devices and book-keeping of how they acquire energ...
Сохранить в:
| Главный автор: | |
|---|---|
| Формат: | |
| Язык: | English |
| Опубликовано: |
Springer
2016
|
| Предметы: | |
| Online-ссылка: | https://scholar.dlu.edu.vn/thuvienso/handle/DLU123456789/59934 |
| Метки: |
Добавить метку
Нет меток, Требуется 1-ая метка записи!
|
| Thư viện lưu trữ: | Thư viện Trường Đại học Đà Lạt |
|---|
Ваш комментарий будет первым!