Advanced Computing in Electron Microscopy
Gorde:
Egile nagusia: | Kirkland, Earl J. |
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Formatua: | Liburua |
Hizkuntza: | English |
Argitaratua: |
Springer International Publishing
2020
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Gaiak: | |
Sarrera elektronikoa: | https://scholar.dlu.edu.vn/thuvienso/handle/DLU123456789/90772 |
Etiketak: |
Etiketa erantsi
Etiketarik gabe, Izan zaitez lehena erregistro honi etiketa jartzen!
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Thư viện lưu trữ: | Thư viện Trường Đại học Đà Lạt |
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Antzeko izenburuak
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Scanning Electron Microscopy and X-Ray Microanalysis. 4th ed.
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Field Emission Scanning Electron Microscopy. 1st ed. 2018
nork: Brodusch, Nicolas, et al.
Argitaratua: (2020) -
Springer Handbook of Microscopy. 1st ed. 2019
nork: Hawkes, Peter W., et al.
Argitaratua: (2020) -
Nanoscale AFM and TEM Observations of Elementary Dislocation Mechanisms. 1st ed. 2017
nork: Veselý, Jozef
Argitaratua: (2020) -
Resonant X-Ray Scattering in Correlated Systems. 1st ed. 2017
nork: Murakami, Youichi, et al.
Argitaratua: (2020)