Advanced Computing in Electron Microscopy

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Advanced Computing in Electron Microscopy

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Opis bibliograficzny
1. autor:	Kirkland, Earl J.
Format:	Książka
Język:	English
Wydane:	Springer International Publishing 2020
Hasła przedmiotowe:	Physics Spectroscopy and Microscopy Image Processing and Computer Vision Characterization and Evaluation of Materials
Dostęp online:	https://scholar.dlu.edu.vn/thuvienso/handle/DLU123456789/90772
Etykiety:	Dodaj etykietę Nie ma etykietki, Dołącz pierwszą etykiete!

Thư viện lưu trữ:	Thư viện Trường Đại học Đà Lạt

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