লেখক অনুসন্ধানের ফলাফল

1

A source-side injection lucky electron model for Schottky barrier metal-oxide-semiconductor devices

অনুযায়ী Chun-Hsing Shih, Ji-Ting Liang, Jhong-Sheng Wang, Nguyễn, Đăng Chiến
প্রকাশিত 2024

Thư viện lưu trữ: Thư viện Trường Đại học Đà Lạt

সম্পূর্ণ পাঠ পাওয়ার জন্য

2

Effects of Edge Thinning on Fowler-Nordheim Tunneling Current of NAND-Type Flash Memory Cells

অনুযায়ী Ji-Ting Liang, Chun-Hsing Shih, Yan-Xiang Luo, Ming-Kun Huang, Nguyễn, Đăng Chiến, Ruei-Kai Shia, Sau-Mou Wu, Chenhsin Lien, Wen-Fa Wu
প্রকাশিত 2024

Thư viện lưu trữ: Thư viện Trường Đại học Đà Lạt

সম্পূর্ণ পাঠ পাওয়ার জন্য

3

Schottky barrier silicon nanowire SONOS memory with ultralow programming and erasing voltages

অনুযায়ী Chun-Hsing Shih, Wei Chang, Yan-Xiang Luo, Ji-Ting Liang, Ming-Kun Huang, Nguyễn, Đăng Chiến, Ruei-Kai Shia, Jr-Jie Tsai, Wen-Fa Wu, Chenhsin Lien
প্রকাশিত 2024

Thư viện lưu trữ: Thư viện Trường Đại học Đà Lạt

সম্পূর্ণ পাঠ পাওয়ার জন্য

4

Impact of edge encroachment on programming and erasing gate current in NAND-type Flash memory

অনুযায়ী Ji-Ting Liang, Chun-Hsing Shih, Wei Chang, Yan-Xiang Luo, Ming-Kun Huang, Nguyễn, Đăng Chiến, Wen-Fa Wu, Sau-Mou Wu, Chenhsin Lien, Riichiro Shirota, Chiu-Tsung Huang, Su Lu, Alex Wang
প্রকাশিত 2024

Thư viện lưu trữ: Thư viện Trường Đại học Đà Lạt

সম্পূর্ণ পাঠ পাওয়ার জন্য