Spatial error analysis : A unified, application-oriented treatment

This book is an all-in-one sourcebook on error measurements in one-, two-, and three-dimensional spaces. This book features exhaustive, systematic coverage of error measurement relationships, techniques, and solutions used to solve general, correlated cases. It is packed with 62 figures and 24 table...

Deskribapen osoa

Gorde:
Xehetasun bibliografikoak
Egile nagusia: Hsu, David Y.
Formatua: Liburua
Hizkuntza:Undetermined
Argitaratua: New York IEEE Press 1999
Gaiak:
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Thư viện lưu trữ: Trung tâm Học liệu Trường Đại học Cần Thơ