Spatial error analysis : A unified, application-oriented treatment

This book is an all-in-one sourcebook on error measurements in one-, two-, and three-dimensional spaces. This book features exhaustive, systematic coverage of error measurement relationships, techniques, and solutions used to solve general, correlated cases. It is packed with 62 figures and 24 table...

詳細記述

保存先:
書誌詳細
第一著者: Hsu, David Y.
フォーマット: 図書
言語:Undetermined
出版事項: New York IEEE Press 1999
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Thư viện lưu trữ: Trung tâm Học liệu Trường Đại học Cần Thơ