Spatial error analysis : A unified, application-oriented treatment

This book is an all-in-one sourcebook on error measurements in one-, two-, and three-dimensional spaces. This book features exhaustive, systematic coverage of error measurement relationships, techniques, and solutions used to solve general, correlated cases. It is packed with 62 figures and 24 table...

पूर्ण विवरण

में बचाया:
ग्रंथसूची विवरण
मुख्य लेखक: Hsu, David Y.
स्वरूप: पुस्तक
भाषा:Undetermined
प्रकाशित: New York IEEE Press 1999
विषय:
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