Spatial error analysis : A unified, application-oriented treatment

This book is an all-in-one sourcebook on error measurements in one-, two-, and three-dimensional spaces. This book features exhaustive, systematic coverage of error measurement relationships, techniques, and solutions used to solve general, correlated cases. It is packed with 62 figures and 24 table...

Deskribapen osoa

Gorde:
Xehetasun bibliografikoak
Egile nagusia: Hsu, David Y.
Formatua: Liburua
Hizkuntza:Undetermined
Argitaratua: New York IEEE Press 1999
Gaiak:
Etiketak: Etiketa erantsi
Etiketarik gabe, Izan zaitez lehena erregistro honi etiketa jartzen!
Thư viện lưu trữ: Trung tâm Học liệu Trường Đại học Cần Thơ
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001 CTU_163195
008 210402s9999 xx 000 0 und d
020 |c 149 
082 |a 621.3 
082 |b H873 
100 |a Hsu, David Y. 
245 0 |a Spatial error analysis : 
245 2 |b A unified, application-oriented treatment 
245 0 |c David Y. Hsu 
260 |a New York 
260 |b IEEE Press 
260 |c 1999 
520 |a This book is an all-in-one sourcebook on error measurements in one-, two-, and three-dimensional spaces. This book features exhaustive, systematic coverage of error measurement relationships, techniques, and solutions used to solve general, correlated cases. It is packed with 62 figures and 24 tables. MATLAB-based M-files* for practical applications created especially for this volume are available on the Web at ftp://ftp.mathworks.com/pub/books/hsu. 
650 |a Kỹ thuật điện,Phân tích lỗi ( Toán học),Electrical engineering,Error analysis (Mathematics) 
650 |x Toán học,Mathematics 
904 |i Bạch Trúc 
980 |a Trung tâm Học liệu Trường Đại học Cần Thơ