Spatial error analysis : A unified, application-oriented treatment

This book is an all-in-one sourcebook on error measurements in one-, two-, and three-dimensional spaces. This book features exhaustive, systematic coverage of error measurement relationships, techniques, and solutions used to solve general, correlated cases. It is packed with 62 figures and 24 table...

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Bibliographic Details
Main Author: Hsu, David Y.
Format: Book
Language:Undetermined
Published: New York IEEE Press 1999
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Institutions: Trung tâm Học liệu Trường Đại học Cần Thơ