X-ray scattering from semiconductors
This text provides a description of the techniques involved in obtaining that information, including X-ray diffractometers and their associated instrument functions, data collection methods, and the simulation of the diffraction patterns observed. Also presented are examples and procedures for inter...
שמור ב:
| מחבר ראשי: | |
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| פורמט: | ספר |
| שפה: | Undetermined |
| יצא לאור: |
London
Imperial College Press
2000
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| נושאים: | |
| תגים: |
הוספת תג
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| Thư viện lưu trữ: | Trung tâm Học liệu Trường Đại học Cần Thơ |
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| LEADER | 01012nam a2200217Ia 4500 | ||
|---|---|---|---|
| 001 | CTU_210740 | ||
| 008 | 210402s9999 xx 000 0 und d | ||
| 020 | |c 2.30 | ||
| 082 | |a 537.622 | ||
| 082 | |b F432 | ||
| 100 | |a Fewster, Paul F. | ||
| 245 | 0 | |a X-ray scattering from semiconductors | |
| 245 | 0 | |c Paul F. Fewster | |
| 260 | |a London | ||
| 260 | |b Imperial College Press | ||
| 260 | |c 2000 | ||
| 520 | |a This text provides a description of the techniques involved in obtaining that information, including X-ray diffractometers and their associated instrument functions, data collection methods, and the simulation of the diffraction patterns observed. Also presented are examples and procedures for interpreting the data to build a picture of the sample, much of which is common to materials other than semiconductors. | ||
| 650 | |a Semiconductors,X-quang,Chất bán dẫn,X-rays | ||
| 650 | |x Tán xạ,Scattering | ||
| 904 | |i Qhieu | ||
| 980 | |a Trung tâm Học liệu Trường Đại học Cần Thơ | ||