X-ray scattering from semiconductors
This text provides a description of the techniques involved in obtaining that information, including X-ray diffractometers and their associated instrument functions, data collection methods, and the simulation of the diffraction patterns observed. Also presented are examples and procedures for inter...
Zapisane w:
| 1. autor: | |
|---|---|
| Format: | Książka |
| Język: | Undetermined |
| Wydane: |
London
Imperial College Press
2000
|
| Hasła przedmiotowe: | |
| Etykiety: |
Dodaj etykietę
Nie ma etykietki, Dołącz pierwszą etykiete!
|
| Thư viện lưu trữ: | Trung tâm Học liệu Trường Đại học Cần Thơ |
|---|
Napisz pierwszy komentarz!