X-ray scattering from semiconductors
This text provides a description of the techniques involved in obtaining that information, including X-ray diffractometers and their associated instrument functions, data collection methods, and the simulation of the diffraction patterns observed. Also presented are examples and procedures for inter...
সংরক্ষণ করুন:
| প্রধান লেখক: | |
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| বিন্যাস: | গ্রন্থ |
| ভাষা: | Undetermined |
| প্রকাশিত: |
London
Imperial College Press
2000
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| বিষয়গুলি: | |
| ট্যাগগুলো: |
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| Thư viện lưu trữ: | Trung tâm Học liệu Trường Đại học Cần Thơ |
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অনুযায়ী Fewster, Paul F
প্রকাশিত 2000
প্রকাশিত 2000
Thư viện lưu trữ:
Trung tâm Học liệu Trường Đại học Thủ Dầu Một
সম্পূর্ণ পাঠ পাওয়ার জন্য
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Search Result 6
অনুযায়ী Fewster, Paul F
প্রকাশিত 2000
প্রকাশিত 2000
Thư viện lưu trữ:
Trung tâm Thư viện - Trường Đại học Công nghiệp TP. Hồ Chí Minh