X-ray scattering from semiconductors

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X-ray scattering from semiconductors

Εμφάνιση άλλων εκδόσεων (4)

This text provides a description of the techniques involved in obtaining that information, including X-ray diffractometers and their associated instrument functions, data collection methods, and the simulation of the diffraction patterns observed. Also presented are examples and procedures for inter...

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Λεπτομέρειες βιβλιογραφικής εγγραφής
Κύριος συγγραφέας:	Fewster, Paul F.
Μορφή:	Βιβλίο
Γλώσσα:	Undetermined
Έκδοση:	London Imperial College Press 2000
Θέματα:	Semiconductors,X-quang,Chất bán dẫn,X-rays Tán xạ,Scattering
Ετικέτες:	Προσθήκη ετικέτας Δεν υπάρχουν, Καταχωρήστε ετικέτα πρώτοι!

Thư viện lưu trữ:	Trung tâm Học liệu Trường Đại học Cần Thơ

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