X-ray scattering from semiconductors
This text provides a description of the techniques involved in obtaining that information, including X-ray diffractometers and their associated instrument functions, data collection methods, and the simulation of the diffraction patterns observed. Also presented are examples and procedures for inter...
Đã lưu trong:
Príomhúdar: | Fewster, Paul F. |
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Formáid: | Leabhar |
Teanga: | Undetermined |
Foilsithe: |
London
Imperial College Press
2000
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Ábhair: | |
Clibeanna: |
Cuir Clib Leis
Gan Chlibeanna, Bí ar an gcéad duine leis an taifead seo a chlibeáil!
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Thư viện lưu trữ: | Trung tâm Học liệu Trường Đại học Cần Thơ |
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Míreanna Comhchosúla
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X-ray scattering from semiconductors
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Foilsithe: (2000) -
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X-ray scattering from semiconductors /
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X-Ray Scattering from Semiconductors
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