X-ray scattering from semiconductors

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X-ray scattering from semiconductors

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This text provides a description of the techniques involved in obtaining that information, including X-ray diffractometers and their associated instrument functions, data collection methods, and the simulation of the diffraction patterns observed. Also presented are examples and procedures for inter...

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Bibliografski detalji
Glavni autor:	Fewster, Paul F.
Format:	Knjiga
Jezik:	Undetermined
Izdano:	London Imperial College Press 2000
Teme:	Semiconductors,X-quang,Chất bán dẫn,X-rays Tán xạ,Scattering
Oznake:	Dodaj oznaku Bez oznaka, Budi prvi tko označuje ovaj zapis!

Thư viện lưu trữ:	Trung tâm Học liệu Trường Đại học Cần Thơ

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