X-ray scattering from semiconductors
This text provides a description of the techniques involved in obtaining that information, including X-ray diffractometers and their associated instrument functions, data collection methods, and the simulation of the diffraction patterns observed. Also presented are examples and procedures for inter...
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| フォーマット: | 図書 |
| 言語: | Undetermined |
| 出版事項: |
London
Imperial College Press
2000
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| Thư viện lưu trữ: | Trung tâm Học liệu Trường Đại học Cần Thơ |
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