X-ray scattering from semiconductors
This text provides a description of the techniques involved in obtaining that information, including X-ray diffractometers and their associated instrument functions, data collection methods, and the simulation of the diffraction patterns observed. Also presented are examples and procedures for inter...
Сохранить в:
| Главный автор: | |
|---|---|
| Формат: | |
| Язык: | Undetermined |
| Опубликовано: |
London
Imperial College Press
2000
|
| Предметы: | |
| Метки: |
Добавить метку
Нет меток, Требуется 1-ая метка записи!
|
| Thư viện lưu trữ: | Trung tâm Học liệu Trường Đại học Cần Thơ |
|---|