X-ray scattering from semiconductors
This text provides a description of the techniques involved in obtaining that information, including X-ray diffractometers and their associated instrument functions, data collection methods, and the simulation of the diffraction patterns observed. Also presented are examples and procedures for inter...
Shranjeno v:
| Glavni avtor: | |
|---|---|
| Format: | Knjiga |
| Jezik: | Undetermined |
| Izdano: |
London
Imperial College Press
2000
|
| Teme: | |
| Oznake: |
Označite
Brez oznak, prvi označite!
|
| Thư viện lưu trữ: | Trung tâm Học liệu Trường Đại học Cần Thơ |
|---|