Atomic-scale templates patterned by ultrahigh vacuum scanning tunneling microscopy on silicon /

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Atomic-scale templates patterned by ultrahigh vacuum scanning tunneling microscopy on silicon /

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Λεπτομέρειες βιβλιογραφικής εγγραφής
Κύριος συγγραφέας:	Walsh, Michael A.
Άλλοι συγγραφείς:	Hersam, Mark C.
Μορφή:	Άρθρο
Γλώσσα:	English
Θέματα:	Feedback-controlled lithography Nanoelectronics Nanolithography Surface chemistry
Ετικέτες:	Προσθήκη ετικέτας Δεν υπάρχουν, Καταχωρήστε ετικέτα πρώτοι!

Thư viện lưu trữ:	Thư viện Trường Đại học Đà Lạt

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