Atomic-scale templates patterned by ultrahigh vacuum scanning tunneling microscopy on silicon /

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Atomic-scale templates patterned by ultrahigh vacuum scanning tunneling microscopy on silicon /

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Detalles Bibliográficos
Autor principal:	Walsh, Michael A.
Otros Autores:	Hersam, Mark C.
Formato:	Artículo
Lenguaje:	English
Materias:	Feedback-controlled lithography Nanoelectronics Nanolithography Surface chemistry
Etiquetas:	Agregar Etiqueta Sin Etiquetas, Sea el primero en etiquetar este registro!

Thư viện lưu trữ:	Thư viện Trường Đại học Đà Lạt

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