Atomic-scale templates patterned by ultrahigh vacuum scanning tunneling microscopy on silicon /

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Atomic-scale templates patterned by ultrahigh vacuum scanning tunneling microscopy on silicon /

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Dades bibliogràfiques
Autor principal:	Walsh, Michael A.
Altres autors:	Hersam, Mark C.
Format:	Article
Idioma:	English
Matèries:	Feedback-controlled lithography Nanoelectronics Nanolithography Surface chemistry
Etiquetes:	Afegir etiqueta Sense etiquetes, Sigues el primer a etiquetar aquest registre!

Thư viện lưu trữ:	Thư viện Trường Đại học Đà Lạt

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