Analysis of the influence of the address electrode width on high-speed addressing using the VT close curve and dynamic vdata margin /
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| Hoofdauteur: | Kim, Yongduk. |
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| Andere auteurs: | Park, Sekwang. |
| Formaat: | Artikel |
| Taal: | English |
| Onderwerpen: | |
| Tags: |
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| Thư viện lưu trữ: | Thư viện Trường Đại học Đà Lạt |
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