Analysis of the influence of the address electrode width on high-speed addressing using the VT close curve and dynamic vdata margin /
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| Hlavní autor: | Kim, Yongduk. |
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| Další autoři: | Park, Sekwang. |
| Médium: | Článek |
| Jazyk: | English |
| Témata: | |
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| Thư viện lưu trữ: | Thư viện Trường Đại học Đà Lạt |
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