Analysis of the influence of the address electrode width on high-speed addressing using the VT close curve and dynamic vdata margin /
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| Autor principal: | Kim, Yongduk. |
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| Outros Autores: | Park, Sekwang. |
| Formato: | Artigo |
| Idioma: | English |
| Assuntos: | |
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| Thư viện lưu trữ: | Thư viện Trường Đại học Đà Lạt |
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