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NIST mixed stain study 3 : DNA quantitation accuracy and its influence on short tandem repeat multiplex signal intensity /

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Bibliographic Details
Other Authors: Butler, John M., Duewer, David L., Kline, Margaret C., Redman, Janette W.
Format: Article
Language:English
Subjects:
DNA
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Institutions: Thư viện Trường Đại học Đà Lạt