NIST mixed stain study 3 : DNA quantitation accuracy and its influence on short tandem repeat multiplex signal intensity /
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| Otros Autores: | Butler, John M., Duewer, David L., Kline, Margaret C., Redman, Janette W. |
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| Formato: | Artículo |
| Lenguaje: | English |
| Materias: | |
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| Thư viện lưu trữ: | Thư viện Trường Đại học Đà Lạt |
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