NIST mixed stain study 3 : DNA quantitation accuracy and its influence on short tandem repeat multiplex signal intensity /

NIST mixed stain study 3 : DNA quantitation accuracy and its influence on short tandem repeat multiplex signal intensity /

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Detalles Bibliográficos
Otros Autores: Butler, John M., Duewer, David L., Kline, Margaret C., Redman, Janette W.
Formato: Artículo
Lenguaje:English
Materias:
Accuracy
DNA
Quantitative analysis
Tandemly repeated sequence
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