Differential charging in X-ray photoelectron spectroscopy : A nuisance or a useful tool ? /
Guardat en:
Autor principal: | Suzer, Sefik. |
---|---|
Format: | Article |
Idioma: | English |
Matèries: | |
Etiquetes: |
Afegir etiqueta
Sense etiquetes, Sigues el primer a etiquetar aquest registre!
|
Thư viện lưu trữ: | Thư viện Trường Đại học Đà Lạt |
---|
Ítems similars
-
Quantitative X-ray photoelectron spectroscopy and time-of-flight secondary ion mass spectrometry characterization of the components in DNA /
per: May, Collin J. -
Characterization of carbon/nitroazobenzene/titanium molecular electronic junctions with photoelectron and raman spectroscopy /
per: Nowak, Aletha M. -
O-phenylenediamine electropolymerization by cyclic voltammetry combined with electrospray ionization-ion trap mass spectrometry /
per: Losito, Ilario. - Spectroscopic and diffraction study of uranium speciation in contaminated vadose zone sediments from the Hanford site, Washington State /
-
Introduction to X-ray spectrometric analysis
per: Bertin, Eugene P
Publicat: (2013)