Surface analysis of polymers by XPS and static SIMS
This in-depth treatment of the instrumentation, physical bases and applications of x-ray photoelectron spectroscopy (XPS) and static secondary ion mass spectroscopy (SSIMS) contains a specific focus on the subject of polymeric materials. XPS and SSIMS are widely accepted as the two most powerful tec...
שמור ב:
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| פורמט: | ספר |
| שפה: | Undetermined |
| יצא לאור: |
Cambridge
Cambridge University Press
1998
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הוספת תג
אין תגיות, היה/י הראשונ/ה לתייג את הרשומה!
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| Thư viện lưu trữ: | Trung tâm Học liệu Trường Đại học Cần Thơ |
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