Fault coverage-driven incremental test generation /

Fault coverage-driven incremental test generation /

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Autor principal:	Simao, Adenilso.
Altres autors:	Petrenko, Alexandre.
Format:	Article
Idioma:	English
Matèries:	Finite-state machines Software testing Test generation
Etiquetes:	Afegir etiqueta Sense etiquetes, Sigues el primer a etiquetar aquest registre!

Thư viện lưu trữ:	Thư viện Trường Đại học Đà Lạt

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