Fault coverage-driven incremental test generation /

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Fault coverage-driven incremental test generation /

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Bibliografski detalji
Glavni autor:	Simao, Adenilso.
Daljnji autori:	Petrenko, Alexandre.
Format:	Članak
Jezik:	English
Teme:	Finite-state machines Software testing Test generation
Oznake:	Dodaj oznaku Bez oznaka, Budi prvi tko označuje ovaj zapis!

Thư viện lưu trữ:	Thư viện Trường Đại học Đà Lạt

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