Ionizing radiation effects in MOS oxides
This volume is intended to serve as an updated critical guide to the extensive literature on the basic physical mechanisms controlling the radiation and reliability responses of MOS oxides. There has been a significant amount of work on the nature of the electrically active defects in MOS oxides whi...
Guardado en:
| Autor principal: | |
|---|---|
| Otros Autores: | |
| Lenguaje: | Undetermined English |
| Publicado: |
Singapore,River Edge, NJ
World Scientific
1999
|
| Materias: | |
| Etiquetas: |
Agregar Etiqueta
Sin Etiquetas, Sea el primero en etiquetar este registro!
|
| Thư viện lưu trữ: | Trung tâm Học liệu Trường Đại học Trà Vinh |
|---|