Ionizing radiation effects in MOS oxides

This volume is intended to serve as an updated critical guide to the extensive literature on the basic physical mechanisms controlling the radiation and reliability responses of MOS oxides. There has been a significant amount of work on the nature of the electrically active defects in MOS oxides whi...

Cur síos iomlán

Đã lưu trong:
Sonraí Bibleagrafaíochta
Príomhúdar: Oldham, Timothy R.
Údair Eile: Timothy R. Oldham
Teanga:Undetermined
English
Foilsithe: Singapore,River Edge, NJ World Scientific 1999
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