Ionizing radiation effects in MOS oxides

This volume is intended to serve as an updated critical guide to the extensive literature on the basic physical mechanisms controlling the radiation and reliability responses of MOS oxides. There has been a significant amount of work on the nature of the electrically active defects in MOS oxides whi...

Täydet tiedot

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Bibliografiset tiedot
Päätekijä: Oldham, Timothy R.
Muut tekijät: Timothy R. Oldham
Kieli:Undetermined
English
Julkaistu: Singapore,River Edge, NJ World Scientific 1999
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