Ionizing radiation effects in MOS oxides
This volume is intended to serve as an updated critical guide to the extensive literature on the basic physical mechanisms controlling the radiation and reliability responses of MOS oxides. There has been a significant amount of work on the nature of the electrically active defects in MOS oxides whi...
সংরক্ষণ করুন:
| প্রধান লেখক: | |
|---|---|
| অন্যান্য লেখক: | |
| ভাষা: | Undetermined English |
| প্রকাশিত: |
Singapore,River Edge, NJ
World Scientific
1999
|
| বিষয়গুলি: | |
| ট্যাগগুলো: |
ট্যাগ যুক্ত করুন
কোনো ট্যাগ নেই, প্রথমজন হিসাবে ট্যাগ করুন!
|
| Thư viện lưu trữ: | Trung tâm Học liệu Trường Đại học Trà Vinh |
|---|