X-ray scattering from semiconductors

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X-ray scattering from semiconductors

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This text provides a description of the techniques involved in obtaining that information, including X-ray diffractometers and their associated instrument functions, data collection methods, and the simulation of the diffraction patterns observed. Also presented are examples and procedures for inter...

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書目詳細資料
主要作者:	Fewster, Paul F.
格式:	圖書
語言:	Undetermined
出版:	London Imperial College Press 2000
主題:	Semiconductors,X-quang,Chất bán dẫn,X-rays Tán xạ,Scattering
標簽:	添加標簽沒有標簽, 成為第一個標記此記錄!

Thư viện lưu trữ:	Trung tâm Học liệu Trường Đại học Cần Thơ

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