Diagnostic measurements in LSI/VLSI integrated circuits production /

में बचाया:

ग्रंथसूची विवरण
मुख्य लेखक:	Jakubowski, Andrzej.
अन्य लेखक:	Marciniak, Wieslaw., Przewlocki, Henryk M.
स्वरूप:	Sách giấy
प्रकाशित:	Singapore ; Teaneck, NJ : World Scientific, c1991.
श्रृंखला:	Advanced series in electrical and computer engineering ; vol. 7
विषय:	Integrated circuits > Very large scale integration > Design and construction. Integrated circuits > Very large scale integration > Testing.
टैग :	टैग जोड़ें कोई टैग नहीं, इस रिकॉर्ड को टैग करने वाले पहले व्यक्ति बनें!

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