Diagnostic measurements in LSI/VLSI integrated circuits production /

Diagnostic measurements in LSI/VLSI integrated circuits production /

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Detaylı Bibliyografya
Yazar: Jakubowski, Andrzej.
Diğer Yazarlar: Marciniak, Wieslaw., Przewlocki, Henryk M.
Materyal Türü: Sách giấy
Baskı/Yayın Bilgisi: Singapore ; Teaneck, NJ : World Scientific, c1991.
Seri Bilgileri:Advanced series in electrical and computer engineering ; vol. 7
Konular:
Integrated circuits > Very large scale integration > Design and construction.
Integrated circuits > Very large scale integration > Testing.
Etiketler: Etiketle
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