Diagnostic measurements in LSI/VLSI integrated circuits production /

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Diagnostic measurements in LSI/VLSI integrated circuits production /

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Dades bibliogràfiques
Autor principal:	Jakubowski, Andrzej.
Altres autors:	Marciniak, Wieslaw., Przewlocki, Henryk M.
Format:	Sách giấy
Publicat:	Singapore ; Teaneck, NJ : World Scientific, c1991.
Col·lecció:	Advanced series in electrical and computer engineering ; vol. 7
Matèries:	Integrated circuits > Very large scale integration > Design and construction. Integrated circuits > Very large scale integration > Testing.
Etiquetes:	Afegir etiqueta Sense etiquetes, Sigues el primer a etiquetar aquest registre!

Thư viện lưu trữ:	Thư viện Trường Đại học Đà Lạt

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