Diagnostic measurements in LSI/VLSI integrated circuits production /

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Diagnostic measurements in LSI/VLSI integrated circuits production /

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Xehetasun bibliografikoak
Egile nagusia:	Jakubowski, Andrzej.
Beste egile batzuk:	Marciniak, Wieslaw., Przewlocki, Henryk M.
Formatua:	Sách giấy
Argitaratua:	Singapore ; Teaneck, NJ : World Scientific, c1991.
Saila:	Advanced series in electrical and computer engineering ; vol. 7
Gaiak:	Integrated circuits > Very large scale integration > Design and construction. Integrated circuits > Very large scale integration > Testing.
Etiketak:	Etiketa erantsi Etiketarik gabe, Izan zaitez lehena erregistro honi etiketa jartzen!

Thư viện lưu trữ:	Thư viện Trường Đại học Đà Lạt

Antzeko izenburuak

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VLSI 81 :
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Principles of CMOS VLSI design: A systems perspective
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Digital integrated circuits : a design perspective /
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Newnes linear IC pocket book /
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Digital integrated circuit design
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Digital integrated circuit design
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Design and applications of analog integrated circuits
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Digital Integrated Circuits: A Design Perspective (2nd Ed)
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Thiết kế vi mạch CMOS VLSI:
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Fractional Linear Systems and Electrical Circuits
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The world of large scale systems
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Microelectronic circuits
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