Diagnostic measurements in LSI/VLSI integrated circuits production /

Diagnostic measurements in LSI/VLSI integrated circuits production /

Wedi'i Gadw mewn:
Manylion Llyfryddiaeth
Prif Awdur: Jakubowski, Andrzej.
Awduron Eraill: Marciniak, Wieslaw., Przewlocki, Henryk M.
Fformat: Sách giấy
Cyhoeddwyd: Singapore ; Teaneck, NJ : World Scientific, c1991.
Cyfres:Advanced series in electrical and computer engineering ; vol. 7
Pynciau:
Integrated circuits > Very large scale integration > Design and construction.
Integrated circuits > Very large scale integration > Testing.
Tagiau: Ychwanegu Tag
Dim Tagiau, Byddwch y cyntaf i dagio'r cofnod hwn!
Thư viện lưu trữ: Thư viện Trường Đại học Đà Lạt
Disgrifiad
Disgrifiad Corfforoll:xv, 356 p. : ill. ; 23 cm.
Llyfryddiaeth:Includes bibliographical references.
ISBN:9810202822

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