Diagnostic measurements in LSI/VLSI integrated circuits production /
Zapisane w:
| 1. autor: | |
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| Kolejni autorzy: | , |
| Format: | Sách giấy |
| Wydane: |
Singapore ; Teaneck, NJ :
World Scientific,
c1991.
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| Seria: | Advanced series in electrical and computer engineering ;
vol. 7 |
| Hasła przedmiotowe: | |
| Etykiety: |
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| Thư viện lưu trữ: | Thư viện Trường Đại học Đà Lạt |
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| Opis fizyczny: | xv, 356 p. : ill. ; 23 cm. |
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| Bibliografia: | Includes bibliographical references. |
| ISBN: | 9810202822 |