Atomic-scale templates patterned by ultrahigh vacuum scanning tunneling microscopy on silicon /

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Atomic-scale templates patterned by ultrahigh vacuum scanning tunneling microscopy on silicon /

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Hlavní autor:	Walsh, Michael A.
Další autoři:	Hersam, Mark C.
Médium:	Článek
Jazyk:	English
Témata:	Feedback-controlled lithography Nanoelectronics Nanolithography Surface chemistry
Tagy:	Přidat tag Žádné tagy, Buďte první, kdo otaguje tento záznam!

Thư viện lưu trữ:	Thư viện Trường Đại học Đà Lạt

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