Atomic-scale templates patterned by ultrahigh vacuum scanning tunneling microscopy on silicon /

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Atomic-scale templates patterned by ultrahigh vacuum scanning tunneling microscopy on silicon /

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Bibliographische Detailangaben
1. Verfasser:	Walsh, Michael A.
Weitere Verfasser:	Hersam, Mark C.
Format:	Artikel
Sprache:	English
Schlagworte:	Feedback-controlled lithography Nanoelectronics Nanolithography Surface chemistry
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

Thư viện lưu trữ:	Thư viện Trường Đại học Đà Lạt

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