Atomic-scale templates patterned by ultrahigh vacuum scanning tunneling microscopy on silicon /

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Atomic-scale templates patterned by ultrahigh vacuum scanning tunneling microscopy on silicon /

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Dettagli Bibliografici
Autore principale:	Walsh, Michael A.
Altri autori:	Hersam, Mark C.
Natura:	Articolo
Lingua:	English
Soggetti:	Feedback-controlled lithography Nanoelectronics Nanolithography Surface chemistry
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Thư viện lưu trữ:	Thư viện Trường Đại học Đà Lạt

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