Atomic-scale templates patterned by ultrahigh vacuum scanning tunneling microscopy on silicon /

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Atomic-scale templates patterned by ultrahigh vacuum scanning tunneling microscopy on silicon /

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書誌詳細
第一著者:	Walsh, Michael A.
その他の著者:	Hersam, Mark C.
フォーマット:	論文
言語:	English
主題:	Feedback-controlled lithography Nanoelectronics Nanolithography Surface chemistry
タグ:	タグ追加タグなし, このレコードへの初めてのタグを付けませんか!

Thư viện lưu trữ:	Thư viện Trường Đại học Đà Lạt

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