Resonance and nonresonant laser ionization of sputtered uranium atoms from thin films and single microparticles : Evaluation of a combined system for particle trace analysis /

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Resonance and nonresonant laser ionization of sputtered uranium atoms from thin films and single microparticles : Evaluation of a combined system for particle trace analysis /

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Dettagli Bibliografici
Altri autori:	Benninghoven, Alfred., Betti, Maria., Erdmann, Nicole., Gruning, Carsten., Kollmer, Felix., Lievens, Peter., Philipsen, Vicky., Silverans, Roger E., Vandeweert, Erno.
Natura:	Articolo
Lingua:	English
Soggetti:	Autoionizing state Microparticle Multiphoton ionization Particle size Resonance ionization mass spectroscopy Thin films Trace analysis Uranium Uranium oxide
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Thư viện lưu trữ:	Thư viện Trường Đại học Đà Lạt

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