A very low bandgap line-tunnel field effect transistor with channel-buried oxide and laterally doped pocket

Low bandgap and line tunneling techniques have demonstrated the most effectiveness in enhancing the on-current of tunnel field-effect transistors (TFETs). This study examines the mechanisms and designs of channel-buried oxide and laterally doped pocket for a very low bandgap line-TFET. Numerical TCA...

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Hlavní autoři: Bui Huu Thai, Chun-Hsing Shih, Nguyễn, Đăng Chiến
Médium: Journal article
Jazyk:English
Vydáno: Trường Đại học Đà Lạt 2024
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On-line přístup:https://scholar.dlu.edu.vn/handle/123456789/3589
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Thư viện lưu trữ: Thư viện Trường Đại học Đà Lạt