Measurement of yield strength for electroplated nickel film using micro-cantilever /

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Measurement of yield strength for electroplated nickel film using micro-cantilever /

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Podrobná bibliografie
Hlavní autor:	Moon, Hyoung-Sik.
Další autoři:	Kim, Joo-Hwan., Kim, Young-Min.
Médium:	Článek
Jazyk:	English
Témata:	Large deflection MEMS Nickel electroplating Yield strength Young's modulus
Tagy:	Přidat tag Žádné tagy, Buďte první, kdo otaguje tento záznam!

Thư viện lưu trữ:	Thư viện Trường Đại học Đà Lạt

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