Measurement of yield strength for electroplated nickel film using micro-cantilever /
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| 主要作者: | Moon, Hyoung-Sik. |
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| 其他作者: | Kim, Joo-Hwan., Kim, Young-Min. |
| 格式: | Bài viết |
| 語言: | English |
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| Thư viện lưu trữ: | Thư viện Trường Đại học Đà Lạt |
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