Measurement of yield strength for electroplated nickel film using micro-cantilever /

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Measurement of yield strength for electroplated nickel film using micro-cantilever /

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Detalhes bibliográficos
Autor principal:	Moon, Hyoung-Sik.
Outros Autores:	Kim, Joo-Hwan., Kim, Young-Min.
Formato:	Artigo
Idioma:	English
Assuntos:	Large deflection MEMS Nickel electroplating Yield strength Young's modulus
Tags:	Adicionar Tag Sem tags, seja o primeiro a adicionar uma tag!

Thư viện lưu trữ:	Thư viện Trường Đại học Đà Lạt

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