Measurement of yield strength for electroplated nickel film using micro-cantilever /

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Measurement of yield strength for electroplated nickel film using micro-cantilever /

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Λεπτομέρειες βιβλιογραφικής εγγραφής
Κύριος συγγραφέας:	Moon, Hyoung-Sik.
Άλλοι συγγραφείς:	Kim, Joo-Hwan., Kim, Young-Min.
Μορφή:	Άρθρο
Γλώσσα:	English
Θέματα:	Large deflection MEMS Nickel electroplating Yield strength Young's modulus
Ετικέτες:	Προσθήκη ετικέτας Δεν υπάρχουν, Καταχωρήστε ετικέτα πρώτοι!

Thư viện lưu trữ:	Thư viện Trường Đại học Đà Lạt

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