Measurement of yield strength for electroplated nickel film using micro-cantilever /

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Measurement of yield strength for electroplated nickel film using micro-cantilever /

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Dades bibliogràfiques
Autor principal:	Moon, Hyoung-Sik.
Altres autors:	Kim, Joo-Hwan., Kim, Young-Min.
Format:	Article
Idioma:	English
Matèries:	Large deflection MEMS Nickel electroplating Yield strength Young's modulus
Etiquetes:	Afegir etiqueta Sense etiquetes, Sigues el primer a etiquetar aquest registre!

Thư viện lưu trữ:	Thư viện Trường Đại học Đà Lạt

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